Model : WIS-100S

System inspects Frame Mounted Wafer after Wafer Dicing
process. It also provides Automated Material Handling System
to prevent any Wafer’s damage.

· Wherever you want to see, just click on position and look at the image
  displayed on the 2nd UI
· Acquires image with the High-Resolution Line Scan Camera to
· compare actual scanned Wafer image with Wafer Map
· Supports Wafer Map edit function and image saving function
· Embedded vision camera in the microscope perfectly substitutes
  your naked eyes
· Controlled by joystick, which supports various control modes
  (X/Y move, diagonal move and step move mode) and has
  versatile buttons (mainly used to edit Bin Code on Wafer Map)