PRODUCT

REEL AUTO LABELING SYSTEM

WAFER INSPECTION SYSTEM

Model : WIS-100S


System inspects Frame Mounted Wafer after Wafer Dicing
process. It also provides Automated Material Handling System
to prevent any Wafer’s damage.


· Wherever you want to see, just click on position and look at the image
  displayed on the 2nd UI
· Acquires image with the High-Resolution Line Scan Camera to
· compare actual scanned Wafer image with Wafer Map
· Supports Wafer Map edit function and image saving function
· Embedded vision camera in the microscope perfectly substitutes
  your naked eyes
· Controlled by joystick, which supports various control modes
  (X/Y move, diagonal move and step move mode) and has
  versatile buttons (mainly used to edit Bin Code on Wafer Map)


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Gaon Korea   
236 Wolbong Banwol-gil, Gwangsan-gu,
Gwangju, South Korea   
Branch : Room 773, Lead Smart Square
Knowledge Industry Center, 1229 Singil-dong,
Danwon-gu, Ansan, Gyeonggi-do,
South Korea
Korean : 070-4880-3613  
English : +82-62-419-3622  
FAX : 0505-300-4613
Business Registration Number :
409-86-44984  
CEO : KIM DO HUN  
Personal Information Manager : Park A-yeon

Copyrightⓒ GAON Co., Ltd.
ALL RIGHTS RESERVED

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