WAFER INSPECTION SYSTEM
Model : WIS-100S
System inspects Frame Mounted Wafer after Wafer Dicing
process. It also provides Automated Material Handling System
to prevent any Wafer’s damage.
· Wherever you want to see, just click on position and look at the image
displayed on the 2nd UI
· Acquires image with the High-Resolution Line Scan Camera to
· compare actual scanned Wafer image with Wafer Map
· Supports Wafer Map edit function and image saving function
· Embedded vision camera in the microscope perfectly substitutes
your naked eyes
· Controlled by joystick, which supports various control modes
(X/Y move, diagonal move and step move mode) and has
versatile buttons (mainly used to edit Bin Code on Wafer Map)
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