Full Automation Level Solutions
System inspects Frame Mounted Wafer after Wafer Dicing process. It also provides Automated Material Handling System to prevent any Wafer’s damage.
  • Wherever you want to see, just click on position, and look at the image displayed on the 2nd UI
  • Acquires image with the High-Resolution Line Scan Camera to compare actual scanned Wafer image with Wafer Map
  • Supports Wafer Map edit function and image saving function
  • Embedded vision camera in the microscope perfectly substitutes your naked eyes
  • Controlled by joystick, which supports various control modes (X/Y move, diagonal move and step move mode) and has versatile buttons (mainly used to edit Bin Code on Wafer Map)