The system improves management method of storage and verification on Skeleton Wafers after D/P processing. Compares the scanned Skeleton Wafer image with Wafer Map File automatically and verify conformity of Die P&P process, such as Die Attach, Chip Attach and DPS.
Applies to 8”, 12” Wafer
Acquire the images of Skeleton Wafers using Line Scan Camera
Recognizes the Wafer Notch direction
Download Wafer Map file from FTP server
Matching the scanned image and Map data by overwrapping
P&P process verification by comparing image with Wafer Map data
(주)가온코리아 I 광주광역시 광산구 월봉반월길 236 I 지사 : 인천광역시 남동구 은봉로 55 SD타워 709,710호 I Korean : 070-4880-3613 I English : +82-62-419-3615 I F.0505-300-4613
사업자등록번호 : 409-86-44984 I 대표 : 김도헌 I 개인정보책임자 : 박아연 Copyrightⓒ2022 GAON Co., Ltd. ALL RIGHTS RESERVED